20 February 2006 High sensitivity measurements of the scattering dispersion of phantoms using spectral domain optical coherence tomography
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Abstract
We demonstrate a novel technique to determine the size of Mie scatterers with high sensitivity. Our technique is based on spectral domain optical coherence tomography measurements of the dispersion that is induced by the scattering process. We use both Mie scattering theory and dispersion measurements of phantoms to show that the scattering dispersion is very sensitive to small changes in the size and/or refractive index of the scatterer.
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Shellee D. Dyer, Tasshi Dennis, Paul A. Williams, Lara K. Street, Shelley M. Etzel, R. Joseph Espejo, Thomas A. Germer, and Thomas E. Milner "High sensitivity measurements of the scattering dispersion of phantoms using spectral domain optical coherence tomography", Proc. SPIE 6079, Coherence Domain Optical Methods and Optical Coherence Tomography in Biomedicine X, 60791Q (20 February 2006); doi: 10.1117/12.649180; https://doi.org/10.1117/12.649180
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