23 February 2006 Use of Bessel beams and position-sensitive detectors in scanning photon microscope for improved field depth and contrast
Author Affiliations +
Abstract
The scanning photon microscope technique is a method of microscopic image formation that employs a laser beam focused on a sample, while non-imaging detector receives the scattered light. The scans are achieved by means of a galvanometer based scanning mirror and a motorized micrometer. The system produces images analogous to the scanning electron microscopy with three-dimensional effects of shadowing and reflection. Compared to a conventional wide-field imaging system, the method allows for a greater ease of operation and flexibility, as the image quality is dependent upon the characteristics of the laser beam, rather than imaging optics. The image resolution on the order of a micron is demonstrated. A further gain in terms of resolution and the depth of focus by employment of Bessel rather than Gaussian beams is discussed. Additionally, we used a position-sensitive quadrant photodiode detector to highlight the overall spatial orientation of the imaged surface as well as its roughness. This concept can be useful in many areas, such as coherence imaging and fluorescence.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Alexander Khmaladze, Alexander Khmaladze, Myung K. Kim, Myung K. Kim, "Use of Bessel beams and position-sensitive detectors in scanning photon microscope for improved field depth and contrast", Proc. SPIE 6090, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XIII, 60900V (23 February 2006); doi: 10.1117/12.645406; https://doi.org/10.1117/12.645406
PROCEEDINGS
8 PAGES


SHARE
Back to Top