23 February 2006 Effects of a pupil filter on stimulated emission depletion microscopy
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Proceedings Volume 6090, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XIII; 60900X (2006); doi: 10.1117/12.647395
Event: SPIE BiOS, 2006, San Jose, California, United States
Abstract
Recently, stimulated emission depletion microscopy has achieved high resolution in fluorescent imaging. In this paper, we present effects of a pupil filter on the performances of stimulated emission depletion microscopy. In stimulated emission depletion microscopy, a saturated zero-centered spot is usually used to achieve a high lateral resolution. Using a half-coated phase plate, a zero-centered spot was made with a narrow and steep gap at the center. Numerical and experimental results show that by simply inserting a central obstacle as a pupil filter, it is possible to reduce the central gap of the zero-centered spot. However in order to compensate inevitable loss of light, which is blocked by the obstacle, increased laser power is required.
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Hongki Yoo, Incheon Song, Taehoon Kim, Daegab Gweon, "Effects of a pupil filter on stimulated emission depletion microscopy", Proc. SPIE 6090, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XIII, 60900X (23 February 2006); doi: 10.1117/12.647395; https://doi.org/10.1117/12.647395
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KEYWORDS
Stimulated emission depletion microscopy

Microscopy

Optical filters

Numerical simulations

Confocal microscopy

Solids

Diffraction

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