Silicon microspheres

Ali Serpengüzel

doi:10.1117/12.669575

22 February 2006 Silicon microspheres

Ali Serpengüzel

Proceedings Volume 6101, Laser Beam Control and Applications; 61010K (2006) https://doi.org/10.1117/12.669575
Event: Lasers and Applications in Science and Engineering, 2006, San Jose, California, United States

Abstract

Morphology-dependent resonances are observed in silicon microspheres, both in the transmission and elastic scattering spectra in the O-band. Approximately 23% of the power is coupled out at the resonance wavelength. The highest observed quality factor for the morphology dependent resonances was on the order of 10⁵. These resonances have a linewidth of 0.007 nm and a mode spacing of 0.19 nm.

Citation Download Citation

Ali Serpengüzel "Silicon microspheres", Proc. SPIE 6101, Laser Beam Control and Applications, 61010K (22 February 2006); https://doi.org/10.1117/12.669575

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