22 February 2006 Silicon microspheres
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Abstract
Morphology-dependent resonances are observed in silicon microspheres, both in the transmission and elastic scattering spectra in the O-band. Approximately 23% of the power is coupled out at the resonance wavelength. The highest observed quality factor for the morphology dependent resonances was on the order of 105. These resonances have a linewidth of 0.007 nm and a mode spacing of 0.19 nm.
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Ali Serpengüzel, Ali Serpengüzel, } "Silicon microspheres", Proc. SPIE 6101, Laser Beam Control and Applications, 61010K (22 February 2006); doi: 10.1117/12.669575; https://doi.org/10.1117/12.669575
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