15 February 2006 Comparative performance studies of indium and gold-tin packaged diode laser bars
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Abstract
This paper is mainly dedicated to a short-time scale reliability study of different packages applied to the same type of laser diode bars: indium and gold-tin packaged laser bars are operated in cw hard-pulse mode with increasing currents until their destruction. The destruction currents serve as guide values for long-time aging tests that should be performed at lower currents. Gold-tin packaged diode lasers turn out to have clearly higher destruction currents in hard-pulse mode. This result is underlined by long-time aging tests at appropriate currents.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
D. Lorenzen, D. Lorenzen, M. Schröder, M. Schröder, J. Meusel, J. Meusel, P. Hennig, P. Hennig, H. König, H. König, M. Philippens, M. Philippens, J. Sebastian, J. Sebastian, R. Hülsewede, R. Hülsewede, } "Comparative performance studies of indium and gold-tin packaged diode laser bars", Proc. SPIE 6104, High-Power Diode Laser Technology and Applications IV, 610404 (15 February 2006); doi: 10.1117/12.659047; https://doi.org/10.1117/12.659047
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