28 February 2006 Unified model of femtosecond laser ionization in bulk solid dielectrics
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Abstract
Ionization dynamics based on various ionization and carrier-loss mechanisms is theoretically studied for bulk crystalline and amorphous solid dielectrics irradiated by ultrashort (femtosecond) laser pulses. Multi-photon ionization is found to be predominant at low laser intensities (Ilas ∼ 10 TW/cm2) with small contribution of avalanche process, which is more significant for amorphous, rather than crystalline materials. At higher intensities - Ilas ~ 102 TW/cm2 - ionization is considerably enhanced by transient bandgap renormalization due to ultrafast ac-Stark effect and multi-particle interactions in electron-hole plasma, but is strongly damped by Auger recombination for electron-hole plasma densities Ne > 1020 cm-3 and accompanied by microscopic damage of corresponding dielectric materials.
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Sergey I. Kudryashov, Sergey I. Kudryashov, } "Unified model of femtosecond laser ionization in bulk solid dielectrics", Proc. SPIE 6108, Commercial and Biomedical Applications of Ultrafast Lasers VI, 61080N (28 February 2006); doi: 10.1117/12.646660; https://doi.org/10.1117/12.646660
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