Detection of high frequency acoustic transients using coherent EUV light

Ra'anan Tobey; Mark Siemens; Margaret Murnane; Henry Kapteyn; Keith Nelson

doi:10.1117/12.640844

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15 February 2006 Detection of high frequency acoustic transients using coherent EUV light

Ra'anan Tobey, Mark Siemens, Margaret Murnane, Henry Kapteyn, Keith Nelson

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Proceedings Volume 6118, Ultrafast Phenomena in Semiconductors and Nanostructure Materials X; 611806 (2006) https://doi.org/10.1117/12.640844
Event: Integrated Optoelectronic Devices 2006, 2006, San Jose, California, United States

Abstract

Ultrafast Extreme Ultraviolet (EUV) radiation is used to probe transient surface phenomenon in three experimental geometries. Optical irradiation of the sample surface generates thermal and acoustic transients that are subsequently probed with a time-delayed EUV pulse. In all experimental geometries we show excellent signal-to-noise ratios (>10:1) and increased sensitivity to surface deformations (<.02nm) directly attributable to the reduced wavelength of the probing light.

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Ra'anan Tobey, Mark Siemens, Margaret Murnane, Henry Kapteyn, and Keith Nelson "Detection of high frequency acoustic transients using coherent EUV light", Proc. SPIE 6118, Ultrafast Phenomena in Semiconductors and Nanostructure Materials X, 611806 (15 February 2006); https://doi.org/10.1117/12.640844

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