15 February 2006 Nanoscale coherent acoustic phonon imaging
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Abstract
An ultrafast optical pump and probe technique known as picosecond ultrasonics is used to generate and detect coherent acoustic phonon pulses in nanostructured films grown on Si wafers. By detecting the phonons after they have diffracted across a millimeter thick wafer, it is possible to measure the scattered phonons in the acoustic far field. Numerical backpropagation algorithms can then be used in order to reconstruct the object which scattered the acoustic phonon pulses. We describe measurements and simulations of experiments performed on surface and sub-surface nanostructures. Results with ~500 nm image resolution are shown, and plans for improving that resolution by an order of magnitude will be described.
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Brian C. Daly, Brian C. Daly, Julien Klein, Julien Klein, Theodore B. Norris, Theodore B. Norris, Stanley Pau, Stanley Pau, Donald M. Tennant, Donald M. Tennant, Joseph A. Taylor, Joseph A. Taylor, John E. Bower, John E. Bower, } "Nanoscale coherent acoustic phonon imaging", Proc. SPIE 6118, Ultrafast Phenomena in Semiconductors and Nanostructure Materials X, 61180U (15 February 2006); doi: 10.1117/12.640367; https://doi.org/10.1117/12.640367
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