7 March 2006 Guided-wave Terahertz devices for sensing the properties of overlaid dielectric films
Author Affiliations +
Abstract
The on-chip detection of nanolitre volumes of dielectric material is demonstrated using terahertz (THz) pulses. Simultaneous analysis at different frequencies on separate, lithographically defined locations is shown to be possible using THz band-stop filter elements connected by a microstrip line. Integrated thin film low-temperature-grown GaAs photoconductive switches are used for THz pulse generation and detection within the microstrip interconnect. This technique is expected to be useful in sensing organic films such as DNA, and other biomolecular materials, in an on-chip environment.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
C. Wood, C. Wood, J. E. Cunningham, J. E. Cunningham, A. G. Davies, A. G. Davies, I. C. Hunter, I. C. Hunter, P. Tosch, P. Tosch, E. H. Linfield, E. H. Linfield, } "Guided-wave Terahertz devices for sensing the properties of overlaid dielectric films", Proc. SPIE 6120, Terahertz and Gigahertz Electronics and Photonics V, 61200P (7 March 2006); doi: 10.1117/12.660716; https://doi.org/10.1117/12.660716
PROCEEDINGS
9 PAGES


SHARE
RELATED CONTENT

Terahertz wave switch using high-resistivity silicon
Proceedings of SPIE (January 03 2008)
Portable terahertz system and its applications
Proceedings of SPIE (June 03 1999)
Photoreflectance for in-situ monitoring of thin-film growth
Proceedings of SPIE (September 30 1990)
Microdisk lasers
Proceedings of SPIE (June 01 1994)

Back to Top