24 February 2006 Fast amplitude and delay measurement for characterization of integrated optic devices
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Abstract
A fast, non-interferometric measurement technique that allows the frequency-dependent delay and amplitude responses to be measured is presented. For a single amplitude and relative phase measurement at a fixed optical wavelength, the measurement time is on the order of a microsecond. RF modulation up to 2.7 GHz can be accommodated. A modified technique using frequency modulation is described to overcome non-idealities in the phase measurement. Results are presented for a fiber Bragg grating and an acetylene gas cell with swept-wavelength laser tuning at a rate of 40 nm/s.
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M. Thompson, H. Zhu, W. Rivera, M. Solmaz, D. Adams, C. K. Madsen, "Fast amplitude and delay measurement for characterization of integrated optic devices", Proc. SPIE 6123, Integrated Optics: Devices, Materials, and Technologies X, 612304 (24 February 2006); doi: 10.1117/12.645911; https://doi.org/10.1117/12.645911
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