Paper
10 February 2006 Effects of optical back reflection on long wavelength VCSELs
M. Steib, Y. Vandyshev, R. Johnson, G. Franz, Hongyu Deng
Author Affiliations +
Abstract
Understanding of the noise characteristics of a long wavelength (LW) vertical cavity surface-emitting laser (VCSEL) under optical back reflection is crucial for its applications in optical fiber data communication. VCSELs at near 1.31μm are tested and the relative intensity noise (RIN) is measured in the presence of different levels of optical reflection intensity. Innovative LW VCSEL packaging solutions are demonstrated to achieve robust low cost error-free data communication systems.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
M. Steib, Y. Vandyshev, R. Johnson, G. Franz, and Hongyu Deng "Effects of optical back reflection on long wavelength VCSELs", Proc. SPIE 6132, Vertical-Cavity Surface-Emitting Lasers X, 613205 (10 February 2006); https://doi.org/10.1117/12.660841
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CITATIONS
Cited by 1 scholarly publication.
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KEYWORDS
Vertical cavity surface emitting lasers

Data communications

Fiber lasers

Eye

Polarization

Packaging

Reflection

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