15 February 2006 Micro-Raman spectroscopy and E-SEM analysis of hybrid layer at the dentine/resin interface of three different composite restorative resins
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Proceedings Volume 6137, Lasers in Dentistry XII; 61370I (2006) https://doi.org/10.1117/12.640317
Event: SPIE BiOS, 2006, San Jose, California, United States
Abstract
The formation of a hybrid layer at the dentin/resin interface is a critical point in the curative processes. New restorative materials are currently under investigation in order to improve the characteristics of this interface layer. In this paper micro-Raman spectroscopy and Environmental Scanning Electron Microscope (E-SEM) analysis have been performed to investigate the interface properties of three different restorative materials. The experimental investigation has been performed on tooth cavities prepared both by Er:YAG laser ablation and by conventional diamond bur. Laser prepared cavities were realized using 100 ms pulsed light beam with energy of 350 mJ, at a frequency of 20 Hz. The cavities were filled with three different composites: True-Vitality (Den-Mat), Enamel Plus (Micerium), Supreme (3M). The treated samples were sectioned perpendicularly to the exposed dentin surface and the morphological characterization of the samples was performed by means of E-SEM operating in wet mode. This equipment permits to obtain a high-resolution image of surface without conductive coating process. The same samples were then examined by micro-Raman spectroscopy that has already shown its validity in the study of dentin/resin interfaces.
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C. Camerlingo, C. Camerlingo, G. M. Gaeta, G. M. Gaeta, R. Riccio, R. Riccio, F. Rosso, F. Rosso, L. Muscariello, L. Muscariello, M. Lepore, M. Lepore, } "Micro-Raman spectroscopy and E-SEM analysis of hybrid layer at the dentine/resin interface of three different composite restorative resins", Proc. SPIE 6137, Lasers in Dentistry XII, 61370I (15 February 2006); doi: 10.1117/12.640317; https://doi.org/10.1117/12.640317
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