2 March 2006 Quantitative evaluation of mercuric iodide thick film for x-ray imaging device
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Abstract
In this paper, we investigated electrical characteristics of the X-ray detector of mercuric iodide (HgI2) film fabricated by PIB(Particle-In-Binder) Method with thicknesses ranging from approximately 200μm to 240μm. In the present study, using I-V measurements, their electrical properties such as leakage current, X-ray sensitivity, and signal-to-noise ratio (SNR),were investigated. The results of our study can be useful in the future design and optimization of direct active-matrix flat-panel detectors (AMFPD) for various digital X-ray imaging modalities.
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Kyung-Jin Kim, Kyung-Jin Kim, Sang-Sik Kang, Sang-Sik Kang, Ji-Koon Park, Ji-Koon Park, Sung-Ho Cho, Sung-Ho Cho, Byung-Youl Cha, Byung-Youl Cha, Jung-Wook Shin, Jung-Wook Shin, Sang-Hee Nam, Sang-Hee Nam, Jae-Hyung Kim, Jae-Hyung Kim, } "Quantitative evaluation of mercuric iodide thick film for x-ray imaging device", Proc. SPIE 6142, Medical Imaging 2006: Physics of Medical Imaging, 61422Z (2 March 2006); doi: 10.1117/12.653002; https://doi.org/10.1117/12.653002
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