Paper
3 March 2006 Novel features of the x-ray scatter profile that are not modeled by convolution of the primary
Author Affiliations +
Abstract
A convolution model of scatter that is adaptable to rapid simulation and correction algorithms is tested against the measured scatter profiles. In the simple case of a uniform acrylic sheet, the convolution approach yields about 10% absolute agreement with the measured scatter profile. However, significant qualitative differences are demonstrated for phantoms with non-uniform thickness or composition. For example, the scatter profile is dependent on a bone's vertical position in the phantom whereas the primary is unchanged. Similarly, a cusp shape in the scatter profile observed near the abrupt edge of an acrylic sheet is not produced in the convolution model. An alternate approach that calculates the scatter as a 3D integral over the object volume can reproduce this behavior.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J. Eric Tkaczyk, Yves Trousset, Deborah Walter, Yanfeng Du, Richard A. Thompson, and Daniel Harrison "Novel features of the x-ray scatter profile that are not modeled by convolution of the primary", Proc. SPIE 6142, Medical Imaging 2006: Physics of Medical Imaging, 614232 (3 March 2006); https://doi.org/10.1117/12.653747
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KEYWORDS
Sensors

Convolution

Lead

3D modeling

Bone

X-rays

Signal detection

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