9 June 2006 Transmission characteristic in random medium thin film
Author Affiliations +
Proceedings Volume 6149, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies; 61491S (2006) https://doi.org/10.1117/12.674254
Event: 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies, 2005, Xian, China
Abstract
By means of transfer matrices, the transmission spectral of random medium thin film is calculated, which consists of two-type medium. It is found that the thin film has selective transmission effect to the light within ultraviolet region, and that the larger the strength of randomness, dielectric constant and thickness of random layer (are), the narrower the half-width of transmission light becomes. Otherwise, no matter how the other parameters change, the light, whose wavelength is equal to the thickness of first layer, can transmit the thin film when the dielectric constant of first layer is one.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Liang Liang, Liang Liang, Y. C. Wang, Y. C. Wang, Zhou Chao, Zhou Chao, } "Transmission characteristic in random medium thin film", Proc. SPIE 6149, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 61491S (9 June 2006); doi: 10.1117/12.674254; https://doi.org/10.1117/12.674254
PROCEEDINGS
5 PAGES


SHARE
Back to Top