9 June 2006 Investigation of photoelectron properties in cubic AgCl emulsion with uniformly doped formate ions
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Proceedings Volume 6149, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies; 61491W (2006) https://doi.org/10.1117/12.674258
Event: 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies, 2005, Xian, China
Abstract
In this experiment the microwave absorption and phase-sensitive detection technique was used to detect the time-resolved signal of photoelectrons generated by 35-ps laser pulses in AgCl emulsions uniformly doped with different concentrations of formate ions (HCO2-). According to photoelectron decay signal, the photoelectron decay properties and the trap-capture properties, influencing the efficiency of latent image formation of the cubic AgCl grains, were discussed. The results indicate that when its concentration is 10-5mol/molAg, the formate ions act as hole traps obviously, enhancing the escape of electrons from pair recombination, but when its concentration is more than or less than 10-5mol/molAg, the formate ions may not act as hole traps effectively. We find that the optimal concentration of uniformly doped formate ions which can increase the photoelectron lifetime effectively is 10-5mol/molAg.
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Guang-Sheng Fu, Guang-Sheng Fu, Xian Zhou, Xian Zhou, Shao-Peng Yang, Shao-Peng Yang, Xiao-Wei Li, Xiao-Wei Li, Xiao-Dong Tian, Xiao-Dong Tian, Li Han, Li Han, } "Investigation of photoelectron properties in cubic AgCl emulsion with uniformly doped formate ions", Proc. SPIE 6149, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 61491W (9 June 2006); doi: 10.1117/12.674258; https://doi.org/10.1117/12.674258
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