9 June 2006 Study of a new portable x-ray source with micro-beam
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Proceedings Volume 6149, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies; 61491Z (2006) https://doi.org/10.1117/12.674261
Event: 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies, 2005, Xian, China
Abstract
A novel X-ray source with micro-beam has been studied in theory and experiment. The source is composed of three portions: LaB6 crystal cathode electron gun emitting system, electrostatic focusing system, and permutable metal target system. The electronic current emitted by the electron-gun are controlled by modulating cathode temperature and Wehnelt grid voltage and ratio Dw/H, two-equal-radius-cylinder-electrodes focusing system concentrates electron beam, the X-ray photons are irradiated by high energy electron beam bombarding the metal target. The new x-ray source's general-purpose capabilities such as continuous radiation and pulse radiation, focus size and luminance, are also tested. When the temperature of LaB6 cathode is about 1900K and partial pressures being kept below 10-7 torr, the minimal focus diameter is merely about 10 microns. The new micro focus x-ray source has other lots of advantages such as economy, safety and facility.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Kaige Wang, Kaige Wang, Ji Li, Ji Li, Qinlao Yang, Qinlao Yang, Jinchuan Guo, Jinchuan Guo, Baoping Guo, Baoping Guo, Xiaomei Kuo, Xiaomei Kuo, Junlan Zhou, Junlan Zhou, Hanben Niu, Hanben Niu, } "Study of a new portable x-ray source with micro-beam", Proc. SPIE 6149, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 61491Z (9 June 2006); doi: 10.1117/12.674261; https://doi.org/10.1117/12.674261
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