Ultra-sensitive near-field Raman detection technique

Shifa Wu; Kun Liu; Shi Pan

doi:10.1117/12.678090

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19 May 2006 Ultra-sensitive near-field Raman detection technique

Shifa Wu; Kun Liu; Shi Pan

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Proceedings Volume 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 61500N (2006) https://doi.org/10.1117/12.678090
Event: 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies, 2005, Xian, China

Abstract

In this report, based on the near-field Raman theory which mechanism is fundamental different with the far-field Raman, a new viewpoint of near-field Raman was brought out. In this view, to be the excitation light, the effect of evanescent light in near-field Raman was emphasized, at same time, the evanescent light component in the Raman scattering light was noticed, too. The sample could be excited through evanescent light and the component of evanescent light in Raman scattering light was collected entirely in the novel ultra-sensitive near-field Raman sample cell. According to the sample cell, initial experiment was performed. The high aperture oil immersed object lens was employed to form excitation light which included evanescent light component. High signal-to-noise surface enhanced Raman scattering (SERS) signal of rat serum was obtained. By analysing the Raman spectrum, it was found that the new Raman peaks come out because of the excitation light including evanescent light.

Citation Download Citation

Shifa Wu, Kun Liu, and Shi Pan "Ultra-sensitive near-field Raman detection technique", Proc. SPIE 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 61500N (19 May 2006); https://doi.org/10.1117/12.678090

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