Development of a surface respond parameters measurement of low responsibility detector

Xianzhong Jian; Fu Zhao; Zipei Ju

doi:10.1117/12.676887

19 May 2006 Development of a surface respond parameters measurement of low responsibility detector

Xianzhong Jian, Fu Zhao, Zipei Ju

Proceedings Volume 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 61502C (2006) https://doi.org/10.1117/12.676887
Event: 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies, 2005, Xian, China

Abstract

A new detecting system of low responsibility detector surface respond is introduced. The testing principle of detector surface respond detecting by laser modulation is given. The instrument consists of a modulation laser, focusing optical system, a week current amplifying circuit, two dimensions movement flat, the data acquisition, computer interface circuit and related software. The critical part of instrument is a focusing optics system with φ5mm aperture and a narrow frequency amplification with 1 MHz frequency. The interface chip of USB is CY7C68013-128TQPF which controls the sampling of the signal and disposing data. The CPLD controls modulating laser, FIFO time and two dimension flat. The result of experiment indicates that the system offers an excellent way for selecting detector of good characteristic and analyzing detectors' respond characteristic. Also it can be used to detect manufacturing, apply heat detector and analyze characteristic of heat detector fields.

Citation Download Citation

Xianzhong Jian, Fu Zhao, and Zipei Ju "Development of a surface respond parameters measurement of low responsibility detector", Proc. SPIE 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 61502C (19 May 2006); https://doi.org/10.1117/12.676887

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