23 February 2006 A new method of scanning image for phase objects
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Abstract
A new method of double point sources interference scanning image for phase object is proposed in the paper. Based on the principle of the light interference, the expressions of the period and its displacement of the interference fringes have been deduced theoretically. The pictures of the fringes are gained by the CCD camera and the data are processed by the image processing technology. A gray-level image and a pseudo color image of the phase object are reconstructed. The scanning image intensity displayed by this method is linear to the phase. The phase accuracy could reaches π/10 ~ π/25, and the range of phase varies from 0 to 2π. The ray path of the experimental system is simple, and the operation is easy.
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Zuo-hua Huang, Feng-chao Chen, "A new method of scanning image for phase objects", Proc. SPIE 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 615030 (23 February 2006); doi: 10.1117/12.678577; https://doi.org/10.1117/12.678577
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