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23 February 2006 Application of wavelet denoising to power spectral density analysis
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Abstract
It is important to describe optical surfaces by means of quantitative measurements. The interferogram obtained by large aperture phase shifting interferometry can help better characterize surface features and provide sufficient description of surface structures. There are several factors affect the measurement results: the optics, electronics and the test environment. Wavelet transformation is an ideal tool to detect trends, discontinuities, and short periodicities on a surface. We have calculated the PSD in three different conditions by simulative analysis, including ideal condition, noise-interference condition and wavelet denosing condition. Comparing these data, we find that the PSD in wavelet denosing is the most similar to it in ideal condition.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Wei Chen, Han-Min Yao, Fan Wu, Shi-bin Wu, and Qiang Chen "Application of wavelet denoising to power spectral density analysis", Proc. SPIE 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 61503O (23 February 2006); https://doi.org/10.1117/12.676487
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