Local frequency and phase analysis of interferogram

Huiping Zeng; Jingang Zhong

doi:10.1117/12.676500

23 February 2006 Local frequency and phase analysis of interferogram

Huiping Zeng, Jingang Zhong

Author Affiliations +

Proceedings Volume 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 61503S (2006) https://doi.org/10.1117/12.676500
Event: 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies, 2005, Xian, China

Abstract

This paper presents an approach to extract local frequency and phase of interferogram from the ridge of its wavelet transform simultaneously. The principle is introduced. A Morlet wavelet is adopted for the continuous wavelet transform of interferogram. A numerical simulation and an experimental example have shown to verify the validity of the method introduced above.

Citation Download Citation

Huiping Zeng and Jingang Zhong "Local frequency and phase analysis of interferogram", Proc. SPIE 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 61503S (23 February 2006); https://doi.org/10.1117/12.676500

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