18 April 2006 Characterization of optical waveguides with very different refractive-index contrasts
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Proceedings Volume 6180, Photonics, Devices, and Systems III; 618014 (2006) https://doi.org/10.1117/12.675691
Event: Photonics, Devices, and Systems III, 2005, Prague, Czech Republic
Abstract
In this contribution we describe the similarities and especially the differences arising when typical methods for the characterization of optical channel waveguides are applied to waveguides fabricated in different substrates that strongly differ in the refractive-index contrast. Behavior of straight channel waveguides fabricated by i) ion-exchange technique K+ ↔ Na+ or Ag+ ↔ Na+ in borosilicate or Er doped silicate glasses, ii) Ti-diffusion into the LiNbO3 substrate, and iii) silicon-on-insulator technology will be compared. Fabry-Perot resonator method based on a highly coherent fine-tunable semiconductor laser using different types of end-fire coupling arrangements will be described. Measurements of basic parameters of the optical waveguides, e.g. optical field distribution, optical losses, group effective index and their spectral dependencies will be presented and their features typical for particular waveguide structures will be compared.
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František Ondráček, František Ondráček, Miroslav Skalský, Miroslav Skalský, Jiři Čtyroký, Jiři Čtyroký, } "Characterization of optical waveguides with very different refractive-index contrasts", Proc. SPIE 6180, Photonics, Devices, and Systems III, 618014 (18 April 2006); doi: 10.1117/12.675691; https://doi.org/10.1117/12.675691
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