CONFERENCE PROCEEDINGS
Advanced Search
Home > Proceedings > Volume 6183 > Article
Paper
20 April 2006 Raman scattering technique in characterization of glasses containing nanoparticles for integrated optoelectronics
M. Ivanda, M. Gotic, S. Music, M. Ristic, M. Gotic, M. Montagna, M. Ferrari, G. C. Righini
Author Affiliations +
Proceedings Volume 6183, Integrated Optics, Silicon Photonics, and Photonic Integrated Circuits; 61830N (2006) https://doi.org/10.1117/12.663756
Event: SPIE Photonics Europe, 2006, Strasbourg, France
Abstract
Low frequency Raman scattering on the acoustic vibrational modes of nanoparticles has been used for determining the size of dielectric, semiconductor and metal nanoparticles embedded in glass. This contribution reports on application of low-frequency Raman scattering on acoustical vibrational modes of nanoparticles. The theoretical background as well as the experimental results of free non-interacting nanoparticles as well as glass containing different nanoparticles for optoelectronics will be presented. The approach is based on a 1/ν dependence of the Raman light of the vibration coupling coefficient and on the fact that each nanocrystallite of diameter D vibrates with its eigenfrequency ν~1/D. The Raman scattering spectra are analyzed using confined acoustical vibrations model. The model-calculation considered homogeneous broadening of the confined acoustical modes due to interaction of the particles with matrix and inhomogeneous broadening due to the contribution of the Raman scattering from the particles of different sizes. The low frequency Raman spectra of different nanoparticles (nc-TiO2, nc-SnO2, nc-CdSxSe1-x, and nc-Si) prepared by Physical Vapour Deposition, thermal quenching and thereafter annealing of glass and sol-gel techniques was used for determination of particles size distribution and results were compared to TEM. The Raman spectroscopy technique has proved to be a simple and fast method that has favorable statistical characteristics due to the macroscopic probe volume and makes in situ measurements possible.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Citation Download Citation
M. Ivanda, M. Gotic, S. Music, M. Ristic, M. Gotic, M. Montagna, M. Ferrari, and G. C. Righini "Raman scattering technique in characterization of glasses containing nanoparticles for integrated optoelectronics", Proc. SPIE 6183, Integrated Optics, Silicon Photonics, and Photonic Integrated Circuits, 61830N (20 April 2006); https://doi.org/10.1117/12.663756
ACCESS THE FULL ARTICLE
ORGANIZATIONAL
Sign in with credentials provided by your organization.
INSTITUTIONAL
Select your institution to access the SPIE Digital Library.
SELECT YOUR INSTITUTION
PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
PERSONAL SIGN IN
No SPIE Account? Create one
PURCHASE THIS CONTENT
SUBSCRIBE TO DIGITAL LIBRARY
50 downloads per 1-year subscription
Members: $195
Non-members: $335 ADD TO CART
25 downloads per 1 - year subscription
Members: $145
Non-members: $250 ADD TO CART
PURCHASE SINGLE ARTICLE
Includes PDF, HTML & Video, when available
Members: $17.00
Non-members: $21.00 ADD TO CART
PROCEEDINGS
 10 PAGES
DOWNLOAD PAPER SAVE TO MY LIBRARY
GET CITATION
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Particles
Raman spectroscopy
Nanoparticles
Raman scattering
Glasses
Silicon
Transmission electron microscopy
RELATED CONTENT
Subscribe to Digital Library
Receive Erratum Email Alert
Back to Top