14 April 2006 Measurement of linewidth enhancement factor of different semiconductor lasers in operating conditions
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Abstract
We apply the self-mixing method for the measurement of the linewidth enhancement factor of several types of semiconductor lasers. The α-factor value above threshold is determined by analysing the small perturbations that occur to the laser when it is subjected to moderate optical feedback, relying on the well-known Lang-Kobayashi equations. The method is applied to Fabry-Perot, VCSEL, External Cavity Laser (ECL), DFB, Quantum Cascade Laser. It is found that for some lasers the α-factor varies with the emitted power, and these variations can be correlated with variations in the laser linewidth.
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Guido Giuliani, Guido Giuliani, Silvano Donati, Silvano Donati, Wolfgang Elsässer, Wolfgang Elsässer, } "Measurement of linewidth enhancement factor of different semiconductor lasers in operating conditions", Proc. SPIE 6184, Semiconductor Lasers and Laser Dynamics II, 61841D (14 April 2006); doi: 10.1117/12.665178; https://doi.org/10.1117/12.665178
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