Interferometric measurement of thermal expansion coefficients and thermo-optic coefficients in ferroelectric crystals

F. Pignatiello; M. De Rosa; P. Ferraro; A. Arie; S. Grilli; L. Sansone; S. De Nicola; P. De Natale

doi:10.1117/12.664037

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28 April 2006 Interferometric measurement of thermal expansion coefficients and thermo-optic coefficients in ferroelectric crystals

F. Pignatiello, M. De Rosa, P. Ferraro, A. Arie, S. Grilli, L. Sansone, S. De Nicola, P. De Natale

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Proceedings Volume 6188, Optical Micro- and Nanometrology in Microsystems Technology; 61880O (2006) https://doi.org/10.1117/12.664037
Event: SPIE Photonics Europe, 2006, Strasbourg, France

Abstract

We demonstrate a dual interferometric technique for simultaneous and independent measurements of the temperature dependence of the thermo-optic and thermal expansion coefficients in ferroelectric crystals. The crystal temperature can be changed from room temperature up to about 200°C by an actively stabilized heater (stability < 0.1°C). The thermal expansion coefficient is determined using a moire interferometer and monitoring the period of a grating written on the z-face of the crystal sample as a function of the temperature of the crystal. The thermo-optic coefficients of both ordinary and extraordinary axes are estimated by measuring the optical path variation measured by a Mach-Zehnder interferometer with one arm passing through the crystal perpendicularly to the crystal z-axis. This method can be applied to a wide variety of optical materials, when an accurate knowledge of the temperature dependence of the refractive index and thermal expansion is needed.

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F. Pignatiello, M. De Rosa, P. Ferraro, A. Arie, S. Grilli, L. Sansone, S. De Nicola, and P. De Natale "Interferometric measurement of thermal expansion coefficients and thermo-optic coefficients in ferroelectric crystals", Proc. SPIE 6188, Optical Micro- and Nanometrology in Microsystems Technology, 61880O (28 April 2006); https://doi.org/10.1117/12.664037

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