22 April 2006 Development of an electro-optic step-by-step sampling system for IC's close electro-magnetic field measurement
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Abstract
In this work we aim to realize a step-by-step electro-optical probe which exploits the linear (Pockels) electro-optic effect to survey the electromagnetic field on the surface of RF integrated circuits. This probe measures the variation of light polarization induced by a lithium niobate crystal immersed in the electric field provided by the DUT. The measurements will demonstrate the main features of this system which can be summarized in non-invasiveness, wide bandwidth, linearity and small spatial resolution. The LiNbO3 crystals have been developed by SELEX Sistemi Integrati S.p.A. Roma, and the whole research activity has been carried out under the sponsorship of the CRdC Nuove Tecnologie per le Attivita Produttive, the Campania Region Centre of Competence on New Technologies.
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Lucio Rossi, Lucio Rossi, G. Breglio, G. Breglio, A. Irace, A. Irace, P. Spirito, P. Spirito, } "Development of an electro-optic step-by-step sampling system for IC's close electro-magnetic field measurement", Proc. SPIE 6189, Optical Sensing II, 61890F (22 April 2006); doi: 10.1117/12.662043; https://doi.org/10.1117/12.662043
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