19 April 2006 Characterization of speckle/despeckling in active millimeter wave imaging systems using a first order 1.5D model
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Abstract
In this paper a simplified "1.5D" modeling approach is presented which can be used to characterize and optimize an entire active millimeter wave imaging system for concealed weapon detection. The method uses Huygens' Principle to compute one field component on selected planes of the imaging set-up. The accuracy of the method is evaluated by comparing it to a rigorous 2D method of moments approach. The model includes the effects of lenses, diffusers, mirrors, object and any other component present in the system. The approach allows fast determination of the influence of each of the system components on the image projected onto the sensor, including effects such e.g. speckle. Also, the effectivity of different speckle reduction techniques, e.g. using a Hadamard diffuser or a multifrequency approach are evaluated in this paper.
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I. Ocket, I. Ocket, B. Nauwelaers, B. Nauwelaers, J. Fostier, J. Fostier, L. Meert, L. Meert, F. Olyslager, F. Olyslager, G. Koers, G. Koers, J. Stiens, J. Stiens, R. Vounckx, R. Vounckx, I. Jager, I. Jager, } "Characterization of speckle/despeckling in active millimeter wave imaging systems using a first order 1.5D model", Proc. SPIE 6194, Millimeter-Wave and Terahertz Photonics, 619409 (19 April 2006); doi: 10.1117/12.661689; https://doi.org/10.1117/12.661689
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