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20 April 2006 Recycling losses and tapered lineic microcavities on SOI
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Abstract
Short microcavities consisting of two identical tapered hole mirrors etched into silicon-on-insulator ridge waveguides are investigated. They are designed for operating at telecom wavelength. We describe theoretically and experimentally two different ways to boost quality factors to some thousands. In one hand, we investigate the adaptation of mode profile to suppress mismatch losses. In an other hand, we explore the recycling of the losses. We obtained quality factor up to 3000, which opens the route to WDM applications.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
P. Velha, J. C. Rodier, P. Lalanne, D. Peyrade, E. Picard, T. Charvolin, and E. Hadji "Recycling losses and tapered lineic microcavities on SOI", Proc. SPIE 6195, Nanophotonics, 61951S (20 April 2006); https://doi.org/10.1117/12.664506
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