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16 May 2006 Test techniques for high performance thermal imaging system characterization
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Abstract
Recent requirements for modern low noise thermal imaging systems demand higher performance and more detailed characterization of the system. The statistical uncertainty inherent to the test system can often provide misleading information about system performance. An example would be a test that eliminates pixels based on certain performance parameters such as noise or responsivity. If the test uncertainty exceeds the true variance of the parameter, the test will yield results indicative of the test system rather than the parameter. This results in good pixels being eliminated that potentially impacts operability goals. A sign that test uncertainty dominates the test results is when operability remains nearly uniform between multiple tests while the pixels marked bad by the test changes between tests. In order to minimize the uncertainty in a test, one must consider all aspects of the test system that can affect test results. Those aspects include the physical construction of the test station as well as the underlying statistics associated with the measurement. This paper will show ongoing efforts at L-3 Cincinnati Electronics to lower test uncertainty, increase test repeatability, and qualify test systems for both focal plane array and system level electro-optics testing of thermal imagers.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
David Forrai, Stephen Bertke, Robert Fischer, and Thomas Back "Test techniques for high performance thermal imaging system characterization", Proc. SPIE 6207, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XVII, 62070Q (16 May 2006); https://doi.org/10.1117/12.664894
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