14 June 2006 Nanometer movements detection by back focal plane interference in laser tweezers
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Proceedings Volume 6254, Seventh International Conference on Correlation Optics; 62540B (2006) https://doi.org/10.1117/12.679908
Event: Seventh International Conference on Correlation Optics, 2005, Chernivsti, Ukraine
Abstract
Small displacements of a microparticle in an optical trap can be measured using back focal plane interferometry. The position of the particle is evaluated by analyzing the fringes pattern obtained by interference between the light scattered by the particle and unscaterred light in the back focal plane of the condenser. The fringes positions are detected with a quadrant photo diode, allowing nanometric precision. In this paper we analyze theoretically some parameters that may influence the measurements: laser power fluctuations, local fluid viscosity, condenser focal length, particle size.
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Monica Nadasan, Revati Kulkarni, and Ovidiu Iancu "Nanometer movements detection by back focal plane interference in laser tweezers", Proc. SPIE 6254, Seventh International Conference on Correlation Optics, 62540B (14 June 2006); doi: 10.1117/12.679908; https://doi.org/10.1117/12.679908
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