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7 June 2006 Experimental study of front and back ablation of metal thin film using ultrashort laser pulses
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Proceedings Volume 6261, High-Power Laser Ablation VI; 626127 (2006)
Event: High-Power Laser Ablation 2006, 2006, Taos, NM, United States
In order to control the technique of laser-induced forward transfer (LIFT) in ultrashort regimes, it is necessary to understand the different basic mechanisms involved during the three steps: ablation-transfer-deposition. Back ablation of Cr thin film has been studied and compared to the front ablation of the same film in the same conditions. Experiments have been performed using ultrashort laser pulses (800 nm, 100 fs). The dynamics of the plumes have been monitored with a gated intensified charge coupled device (ICCD) camera. Image analysis gave us indications on the velocity and the composition of the ejected material. A parametric study of the ablation thresholds and ablation dynamics has been carried out as a function of the incident laser fluence and the thickness of the metal layer. These results contribute to optimize a process of LIFT. Transfers of Cr on glass and Silicon were obtained with a good spatial resolution.
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Anne-Patricia Alloncle, Renaud Bouffaron, Jörg Hermann, and Marc Sentis "Experimental study of front and back ablation of metal thin film using ultrashort laser pulses", Proc. SPIE 6261, High-Power Laser Ablation VI, 626127 (7 June 2006);

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