Translator Disclaimer
13 June 2006 Novel x-ray optics with Si wafers and formed glass
Author Affiliations +
Abstract
The thermally formed thin glass foils and optically shaped Si wafers are considered to belong to the most promising technologies for future large space X-ray telescopes. We present and discuss the recent progress in these technologies, as well as properties of test mirrors produced and tested. For both technologies, both flat and curved samples have been produced and tested. The achieved profile accuracy is of order of 1 micrometer or better, while the bending technologies maintain the intrinsic fine surface microroughness of substrates (better than 0.5 nm for glass and around 0.1 nm for Si wafers).
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
R. Hudec, L. Pina, V. Semencova, A. Inneman, M. Skulinova, L. Sveda, M. Mika, V. Brozek, R. Kacerovsky, J. Prokop, and J. Sik "Novel x-ray optics with Si wafers and formed glass", Proc. SPIE 6266, Space Telescopes and Instrumentation II: Ultraviolet to Gamma Ray, 62661H (13 June 2006); https://doi.org/10.1117/12.673306
PROCEEDINGS
12 PAGES


SHARE
Advertisement
Advertisement
RELATED CONTENT

Imaging properties of a silicon wafer x-ray telescope
Proceedings of SPIE (November 11 1994)
Advanced x-ray optics with Si wafers and slumped glass
Proceedings of SPIE (August 31 2009)
Novel technologies for x-ray multi-foil optics
Proceedings of SPIE (August 31 2005)
Novel design of a large x ray optical system for...
Proceedings of SPIE (October 15 2012)
Progress in x ray optics development with formed glass and...
Proceedings of SPIE (September 20 2007)
Recent progress with x ray optics based on Si wafers...
Proceedings of SPIE (July 15 2008)
Back-up technologies for IXO
Proceedings of SPIE (April 30 2009)

Back to Top