15 June 2006 An x-ray polarimeter for hard x-ray optics
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Abstract
Development of multi-layer optics makes feasible the use of X-ray telescope at energy up to 60-80 keV: in this paper we discuss the extension of photoelectric polarimeter based on Micro Pattern Gas Chamber to high energy X-rays. We calculated the sensitivity with Neon and Argon based mixtures at high pressure with thick absorption gap: placing the MPGC at focus of a next generation multi-layer optics, galatic and extragalactic X-ray polarimetry can be done up till 30 keV.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Fabio Muleri, Fabio Muleri, Ronaldo Bellazzini, Ronaldo Bellazzini, Enrico Costa, Enrico Costa, Paolo Soffitta, Paolo Soffitta, Francesco Lazzarotto, Francesco Lazzarotto, Marco Feroci, Marco Feroci, Luigi Pacciani, Luigi Pacciani, Alda Rubini, Alda Rubini, Ennio Morelli, Ennio Morelli, Luca Baldini, Luca Baldini, Francesco Bitti, Francesco Bitti, Alessandro Brez, Alessandro Brez, Francesco Cavalca, Francesco Cavalca, Luca Latronico, Luca Latronico, Marco Maria Massai, Marco Maria Massai, Nicola Omodei, Nicola Omodei, Michele Pinchera, Michele Pinchera, Carmelo Sgró, Carmelo Sgró, Gloria Spandre, Gloria Spandre, Giorgio Matt, Giorgio Matt, Giuseppe Cesare Perola, Giuseppe Cesare Perola, Oberto Citterio, Oberto Citterio, Giovanni Pareschi, Giovanni Pareschi, Vincenzo Cotroneo, Vincenzo Cotroneo, Daniele Spiga, Daniele Spiga, Rodolfo Canestrari, Rodolfo Canestrari, } "An x-ray polarimeter for hard x-ray optics", Proc. SPIE 6266, Space Telescopes and Instrumentation II: Ultraviolet to Gamma Ray, 62662X (15 June 2006); doi: 10.1117/12.671975; https://doi.org/10.1117/12.671975
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