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29 June 2006 CCD testing and characterization for dark energy survey
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Abstract
A description of the plans and infrastructure developed for CCD testing and characterization for the DES focal plane detectors is presented. Examples of the results obtained are shown and discussed in the context of the device requirements for the survey instrument.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J. Estrada, T. Abbott, B. Angstadt, L. Buckley-Geer, M. Brown, J. Campa, L. Cardiel, H. Cease, B. Flaugher, K. Dawson, G. Derylo, H. T. Diehl, S. Gruenendahl, I. Karliner, W. Merrit, P. Moore, T. C. Moore, N. Roe, V. Scarpine, R. Schmidt, M. Schubnel, T. Shaw, W. Stuermer, and J. Thaler "CCD testing and characterization for dark energy survey", Proc. SPIE 6269, Ground-based and Airborne Instrumentation for Astronomy, 62693K (29 June 2006); doi: 10.1117/12.672596; https://doi.org/10.1117/12.672596
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