31 May 2006 Extracting system of ion source for deflection of beam at entrance of monopole mass-analyzer
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Proceedings Volume 6278, Seventh Seminar on Problems of Theoretical and Applied Electron and Ion Optics; 62780D (2006) https://doi.org/10.1117/12.693195
Event: Seventh Seminar on Problems of Theoretical and Applied Electron and Ion Optics, 2005, Moscow, Russian Federation
Abstract
The ion-optical system forming the beam on the entrance of the monopole mass-spectrometer has been proposed. Its general features are the earthing of the emacting electrode to decrease the energy spread in the beam and using of the deflecting system of the untraditional construction (good combining with the axially symmetrical electrodes) which does not let the scattering electrons pass in monopole. The analytical expression of the potential distribution in such deflecting system has been found. The calculation of the ion trajectories has been made by the author program. The parameters of the investigated system and earlier used one in the monopole mass-spectrometer have been compared.
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T. Ya. Fishkova, T. Ya. Fishkova, L. P. Ovsyannikova, L. P. Ovsyannikova, V. A. Surkov, V. A. Surkov, } "Extracting system of ion source for deflection of beam at entrance of monopole mass-analyzer", Proc. SPIE 6278, Seventh Seminar on Problems of Theoretical and Applied Electron and Ion Optics, 62780D (31 May 2006); doi: 10.1117/12.693195; https://doi.org/10.1117/12.693195
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