Paper
29 January 2007 Source rock maturity study by capillary tube interferometer
Ailing Yang, Wendong Li, Junyu Dong, Jinliang Zhang
Author Affiliations +
Proceedings Volume 6279, 27th International Congress on High-Speed Photography and Photonics; 62794W (2007) https://doi.org/10.1117/12.725566
Event: 27th International congress on High-Speed Photography and Photonics, 2006, Xi'an, China
Abstract
The mechanism of capillary tube interferometer is expected to be two-beam interference by ray tracing. A computer program to simulate the interference fringe pattern was established. By comparing the simulated fringe pattern and experimental fringe pattern, the refractive index of the liquid can be given when the two fringes coincide best. The results of this method are very near the Abbe refratometer. In the first time, the refractive indices of the low transparent extraction of source rocks were measured by capillary tube interferometer. A curve between the refractive indices of the diluted extraction of source rocks and corresponding vitrinite reflectance Ro was established. When Ro is in the range of 0.36-1.25, the refractive indices of the extraction increase with Ro, or the maturity of the source rocks. Good correlation was observed between the refractive indices and vitrinite reflectance Ro. The refractive index of the extraction of source rock is valuable for determining the degree of maturity of source rock. This technique is promising to measure the refractive indices of low transparent liquids and could be used to estimate the maturity of source rock.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ailing Yang, Wendong Li, Junyu Dong, and Jinliang Zhang "Source rock maturity study by capillary tube interferometer", Proc. SPIE 6279, 27th International Congress on High-Speed Photography and Photonics, 62794W (29 January 2007); https://doi.org/10.1117/12.725566
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KEYWORDS
Refractive index

Capillaries

Liquids

Interferometers

Reflectivity

Fringe analysis

Geometrical optics

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