29 January 2007 High-speed phase shifting profilometry with dual-frequency digital projection grating pattern
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Proceedings Volume 6279, 27th International Congress on High-Speed Photography and Photonics; 62794Y (2007) https://doi.org/10.1117/12.725569
Event: 27th International congress on High-Speed Photography and Photonics, 2006, Xi'an, China
Abstract
An investigation of optical shape and profile measurement technique with respect to dual-frequency digital projection grating pattern is presented in this paper. Two gratings with different frequencies are respectively projected onto an object for the extension of the unambiguity range. And then, grating patterns which are deformed according to the object shape are acquired by a CCD camera. The 3D shape of object surface is reconstructed by using dual-frequency-combination phase-shifting profilometry (PSP) algorithm which is especially presented. Several advantages of using new algorithm instead of other traditional approaches are adequately discussed in practical measurement. Comparing to either conventional PSP or dual frequency PSP, dual-frequency-combination PSP has speediness advantage because of no phase unwrapping process and other additive processes. Furthermore, the analysis proves that the variance of phase in dual-frequency-combination PSP is much steadier than that in dual-frequency PSP. Finally experimental results demonstrated the feasibility of this technique for high-speed surface profile measurement.
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Yanming Chen, Yanming Chen, Yuming He, Yuming He, Eryi Hu, Eryi Hu, Hongmao Zhu, Hongmao Zhu, } "High-speed phase shifting profilometry with dual-frequency digital projection grating pattern", Proc. SPIE 6279, 27th International Congress on High-Speed Photography and Photonics, 62794Y (29 January 2007); doi: 10.1117/12.725569; https://doi.org/10.1117/12.725569
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