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Analysis of (TiO2)X(Ta2O5)1-X composite films prepared by radio frequency ion beam sputtering deposition
Advanced optical coating technology used in the development of concentrator arrays for solar space power applications
Transmission ellipsometry of transparent-film transparent-substrate systems: polynomial inversion for the substrate optical constant
X-measuring ellipsometer (XME): a novel ellipsometric technique to fully characterize film-substrate systems