Dispersive interferometry using femtosecond pulse laser for measuring refractive index and physical thickness of test samples

Ki-Nam Joo; Seung-Woo Kim

doi:10.1117/12.678461

14 August 2006 Dispersive interferometry using femtosecond pulse laser for measuring refractive index and physical thickness of test samples

Ki-Nam Joo, Seung-Woo Kim

Author Affiliations +

Proceedings Volume 6292, Interferometry XIII: Techniques and Analysis; 62920N (2006) https://doi.org/10.1117/12.678461
Event: SPIE Optics + Photonics, 2006, San Diego, California, United States

Abstract

We present a new scheme of dispersive interferometry utilizing a femtosecond pulse laser for the dispersion-insensitive measurement of the refractive index of an optical material. Not only the group refractive index but also the variation of the phase refractive index with wavelength is determined without prior knowledge. Experiment results obtained from specimens of BK7 and UV silica are discussed.

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Ki-Nam Joo and Seung-Woo Kim "Dispersive interferometry using femtosecond pulse laser for measuring refractive index and physical thickness of test samples", Proc. SPIE 6292, Interferometry XIII: Techniques and Analysis, 62920N (14 August 2006); https://doi.org/10.1117/12.678461

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