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14 August 2006 Current-induced frequency modulation characteristics in semiconductor lasers using a novel and simple method
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Abstract
In this paper, a simple method for measuring current-induced frequency modulation characteristics of semiconductor lasers is reported. In this method, no complicated optical and measuring system is needed and is easy for practical application. The experimental results in low modulation frequency range show 0.2% in accuracy is achieved and the system is fit for measuring the current-induced frequency modulation characteristics of semiconductor lasers.
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Jianhui Zhu, Min Zhang, Yanbiao Liao, and Jin Tang "Current-induced frequency modulation characteristics in semiconductor lasers using a novel and simple method", Proc. SPIE 6293, Interferometry XIII: Applications, 62930V (14 August 2006); https://doi.org/10.1117/12.678212
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