Maximizing the resolution of a CTIS instrument

Nathan Hagen; Eustace L. Dereniak; David T. Sass

doi:10.1117/12.680750

1 September 2006 Maximizing the resolution of a CTIS instrument

Nathan Hagen, Eustace L. Dereniak, David T. Sass

Proceedings Volume 6302, Imaging Spectrometry XI; 63020L (2006) https://doi.org/10.1117/12.680750
Event: SPIE Optics + Photonics, 2006, San Diego, California, United States

Abstract

Computed Tomographic Imaging Spectrometry (CTIS) is a technique which has been around for over a decade, providing snapshot measurements of datacubes as large as (x,y,λ) = (100,100,300). We discuss the difficulties with maximizing the resolution of a CTIS instrument and some new grating design ideas for realizing performance improvements.

Citation Download Citation

Nathan Hagen, Eustace L. Dereniak, and David T. Sass "Maximizing the resolution of a CTIS instrument", Proc. SPIE 6302, Imaging Spectrometry XI, 63020L (1 September 2006); https://doi.org/10.1117/12.680750

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