29 August 2006 Direct wavefront phase measurement using point diffraction interferometer with application to large scale AO
Author Affiliations +
Abstract
Interferometric techniques are attractive in wavefront sensing because they give a direct measure of the phase, which means they are useful for use with a piston-only wavefront corrector (such as a liquid crystal spatial light modulator, or some MEMS mirrors). We describe a novel method of implementing a common-path phase-shifting point diffraction interferometric wavefront sensor. The sensor simultaneously gives two phase-shifted outputs which can be used to drive a phase-only wavefront corrector. The device can also give a null output which can be used to calibrate any scintillation.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Andrew K. Kirby, Andrew K. Kirby, Thomas J. D. Oag, Thomas J. D. Oag, Gordon D. Love, Gordon D. Love, } "Direct wavefront phase measurement using point diffraction interferometer with application to large scale AO", Proc. SPIE 6306, Advanced Wavefront Control: Methods, Devices, and Applications IV, 63060I (29 August 2006); doi: 10.1117/12.679441; https://doi.org/10.1117/12.679441
PROCEEDINGS
6 PAGES


SHARE
Back to Top