The reliability of the laser diode arrays

Aleksey Vasilyev; Elisavet Troupaki; Graham R. Allan; Nasir B. Kashem; Mark A. Stephen

doi:10.1117/12.679599

29 August 2006 The reliability of the laser diode arrays

Aleksey Vasilyev, Elisavet Troupaki, Graham R. Allan, Nasir B. Kashem, Mark A. Stephen

Proceedings Volume 6308, Photonics for Space Environments XI; 63080G (2006) https://doi.org/10.1117/12.679599
Event: SPIE Optics + Photonics, 2006, San Diego, California, United States

Abstract

NASA is conducting a series of component-level tests, to better understand the reliability and the effects of a spacebased environment on the operation of diode-pumped, solid-state lasers by simulating the unique and harsh environment of launch, vacuum and radiation exposure of a typical mission. We report on our continuing work on high-power, laser-diode arrays (LDA) which are used as an energy source for several proposed and currently flying diode-pumped solid-state lasers missions (ICESAT, MESSENGER and LRO.) The laser-diode arrays are a critical component which can determine the reliability of the whole laser system. NASA needs reliability and performance data for these components to minimize the risks for space-based laser programs. We are concentrating on laser diode arrays emitting at 808 nm and operating quasi-cw with peak powers of ~100 watts per bar at 100 amps. The laser diode arrays are operated with a duty cycle from 0.6% to 2% and current pulses from 50 to 100 amps peak. We studied the effects of power cycling and temperature cycling on the performance of the diode arrays. We also conducted vacuum test as well as vibration and radiation tests. The laser diode arrays have accumulated more then 5.0 billion pulses during some of these tests and continue to operate within specifications.

Citation Download Citation

Aleksey Vasilyev, Elisavet Troupaki, Graham R. Allan, Nasir B. Kashem, and Mark A. Stephen "The reliability of the laser diode arrays", Proc. SPIE 6308, Photonics for Space Environments XI, 63080G (29 August 2006); https://doi.org/10.1117/12.679599

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