SXR optical diagnostics of capillary discharge plasma

L. Pina; A. Jancarek; M. Vrbova; M. Tamas; J. Blazej; R. Havlikova; P. Vrba; G. Tomassetti; A. Ritucci

doi:10.1117/12.684051

13 September 2006 SXR optical diagnostics of capillary discharge plasma

L. Pina, A. Jancarek, M. Vrbova, M. Tamas, J. Blazej, R. Havlikova, P. Vrba, G. Tomassetti, A. Ritucci

Proceedings Volume 6317, Advances in X-Ray/EUV Optics, Components, and Applications; 631707 (2006) https://doi.org/10.1117/12.684051
Event: SPIE Optics + Photonics, 2006, San Diego, California, United States

Abstract

Pinching capillary discharge in nitrogen is investigated for the purpose of development of laser recombination pumping. An apparatus, previously realized for argon capillary laser pumping, was used to understand details of pinching mechanism and emission characteristics for capillary filled by nitrogen. Time dependences of radiation intensities emitted in the wavelength range 1.9 - 2.5 nm and time integrated in the spectral range 10 - 20 nm were measured under various pressures. A computer model is used to describe the pinch dynamics and to estimate the radiation characteristics. EUV reflection grating spectrometer coupled to BI CCD camera and filtered PIN diode were used for time integrated and time resolved spectral measurements respectively. The measured profiles of radiation intensities are compared with the computer simulations of time dependences of selected energy level populations that correspond to the hydrogen- and helium- like ion line emission in the detected spectral range. Complex method for spectral image restoration was developed.

Citation Download Citation

L. Pina, A. Jancarek, M. Vrbova, M. Tamas, J. Blazej, R. Havlikova, P. Vrba, G. Tomassetti, and A. Ritucci "SXR optical diagnostics of capillary discharge plasma", Proc. SPIE 6317, Advances in X-Ray/EUV Optics, Components, and Applications, 631707 (13 September 2006); https://doi.org/10.1117/12.684051

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