7 September 2006 A hard x-ray KB-FZP microscope for tomography with sub-100-nm resolution
Author Affiliations +
An instrument for high-resolution imaging and tomography has been built at the APS beamline 34 ID-C, Argonne National Laboratory. In-line phase contrast tomography can be performed with micrometer resolution. For imaging and tomography with resolution better than 100nm a hard X-ray microscope has been integrated to the instrument. It works with a Kirkpatrick-Baez (KB) mirror as condenser and a Fresnel-Zone plate (FZP) as an objective lens. 50 nm-features have been resolved in a Nickel structure operating the microscope at a photon energy of 9keV. Phase objects with negligible absorption contrast have been imaged. Tomography scans were performed on photonic crystals.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
C. Rau, C. Rau, V. Crecea, V. Crecea, C.-P. Richter, C.-P. Richter, K. M. Peterson, K. M. Peterson, P. R. Jemian, P. R. Jemian, U. Neuhäusler, U. Neuhäusler, G. Schneider, G. Schneider, X. Yu, X. Yu, P. V. Braun, P. V. Braun, T.-C. Chiang, T.-C. Chiang, I. K. Robinson, I. K. Robinson, } "A hard x-ray KB-FZP microscope for tomography with sub-100-nm resolution", Proc. SPIE 6318, Developments in X-Ray Tomography V, 63181G (7 September 2006); doi: 10.1117/12.680975; https://doi.org/10.1117/12.680975

Back to Top