18 September 2006 A novel display metrology method for LED backlight system
Author Affiliations +
This study develops a statistical prediction model for backlight systems based on a semi-analytical and experimental approach. The prediction model features an iteration algorithm which uses experimental measurements of the luminance, luminance cone angle and luminous efficiency to generate highly accurate luminance predictions. The prediction model allows the effects of manufacturing errors or uncertainties which cause a deviation of the luminance cone angle or an uneven luminance uniformity to be accessed. The results show that achieving an even luminance cone angle, i.e. a smaller mean and standard deviation of the luminance cone angle, is essential if the backlight luminance level required to achieve a high-brightness backlight is to be enhanced. It is shown that improving the luminance uniformity of the backlight is beneficial in increasing the luminance level. However, the influence of the backlight luminance uniformity is not as great as that of the luminance cone angle. Finally, a comparison between the analytical and experimental results shows that a good agreement exists between the results of the proposed statistical model and the experimental data.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jee-Gong Chang, Lun-De Liao, Chi-Chuan Hwang, "A novel display metrology method for LED backlight system", Proc. SPIE 6338, Nonimaging Optics and Efficient Illumination Systems III, 63380I (18 September 2006); doi: 10.1117/12.678031; https://doi.org/10.1117/12.678031


Hollow backlight parametric study
Proceedings of SPIE (December 17 2014)
Direct LED backlight for large area LCD TVs brightness...
Proceedings of SPIE (September 14 2007)
A white-and-blue mixed LED backlight for airplane display
Proceedings of SPIE (November 24 2009)
Advanced flat panel display backlighting techniques
Proceedings of SPIE (April 17 2008)
Random and non overlap dot generation for light guide used...
Proceedings of SPIE (February 01 2006)
Backlight pattern optimization
Proceedings of SPIE (November 28 2007)

Back to Top