15 September 2006 Systematic error compensation in electronic speckle pattern shearing interferometry
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Proceedings Volume 6341, Speckle06: Speckles, From Grains to Flowers; 63411J (2006) https://doi.org/10.1117/12.695375
Event: Speckle06: Speckles, From Grains to Flowers, 2006, Nimes, France
Abstract
Electronic speckle pattern shearing interferometry (ESPSI), also known as digital shearography, is a hole-field non-destructive, optical technique used to measure approximately the field of displacement derivatives. The accurate measurements of these derivatives have several problems one of them is that of ESPSI results are approximately equal to the derivatives, they are equal to the derivatives only if the shear distance tends to zero, hence, if experimental data rendered by ESPSI are taken directly as equal to the derivatives, the measurements may carry an important shearing error. Other error, ESPSI yields values relative to a reference value at a specific location of the field that can be very difficult to determine accurately. In this paper, we propose a general procedure to compensate the shearing error and to introduce the reference by adding two quantities to the values rendered by ESPSI. As an example, we measured a displacement derivative field induced on a metallic sheet specimen by applying tensile load.
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R. Rodríguez-Vera, R. R. Cordero, F. Labbe, J. A. Rayas, Amalia Martínez, F. Mendoza-Santoyo, "Systematic error compensation in electronic speckle pattern shearing interferometry", Proc. SPIE 6341, Speckle06: Speckles, From Grains to Flowers, 63411J (15 September 2006); doi: 10.1117/12.695375; https://doi.org/10.1117/12.695375
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