Paper
15 September 2006 Evaluation of the error in 3D deformation measurement from the combination of in-plane and out-of-plane ESPI interferometers
Author Affiliations +
Proceedings Volume 6341, Speckle06: Speckles, From Grains to Flowers; 63412C (2006) https://doi.org/10.1117/12.695498
Event: Speckle06: Speckles, From Grains to Flowers, 2006, Nimes, France
Abstract
We report on the errors obtained by comparing the in- and out-of-plane displacements calculated from the sensitivity matrix with all its components and when it is considered only the component of the largest contributing of each one of the three interferometers. Divergent illumination is considered in the sensitivity vectors evaluation to measure displacement vector components. This analysis is made for a flat elastic target by using of Electronic Speckle Pattern Interferometry (ESPI).
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Amalia Martínez and Juan Antonio Rayas "Evaluation of the error in 3D deformation measurement from the combination of in-plane and out-of-plane ESPI interferometers", Proc. SPIE 6341, Speckle06: Speckles, From Grains to Flowers, 63412C (15 September 2006); https://doi.org/10.1117/12.695498
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KEYWORDS
Interferometers

3D metrology

3D acquisition

Speckle

Phase measurement

Interferometry

Speckle pattern

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